Thickness dependence of reflection-absorption infrared spectra of supported thin polymer films

Macromolecules

Volumn 44, Issue 7, 2011, Pages 1775-1778

  Djak, M ^a   Gilli, E ^a   Kontturi, Eero ^b   Schennach, R ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS CELLULOSE; ANALYSIS OF POLYMERS; BAND SHIFT; CHEMICAL CHANGE; HCL SOLUTION; INFRARED SPECTRUM; REFLECTION ABSORPTION INFRARED SPECTROSCOPY; REFLECTION-ABSORPTION; SPECTRAL BAND; SPIN-COATED FILMS; THICKNESS DEPENDENCE; THICKNESS DETERMINATION; THICKNESS VALUE; THIN POLYMER FILMS; TRIMETHYLSILYL CELLULOSE; ULTRA-THIN;

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; AMORPHOUS SILICON; CELLULOSE; CHEMICAL ANALYSIS; HYDROCHLORIC ACID; INFRARED SPECTROSCOPY; PLASTIC FILMS; POLYMER FILMS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; ULTRATHIN FILMS;

CELLULOSE FILMS;

EID: 79953905622     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma102905v     Document Type: Article

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