Extraction of region contour in SEM fractographs

Proceedings - 2nd International Conference on Emerging Applications of Information Technology, EAIT 2011

Volumn , Issue , 2011, Pages 98-101

  Banerjee, Siddhartha ^a   Basu, Kaustav ^b   Chakraborti, Pravash Chandra ^b   Saha, Sanjoy Kumar ^b  

^a R K M Residential College   (India)

^b JADAVPUR UNIVERSITY   (India)

Author keywords

Fractograph analysis; Surface void boundary extraction

Indexed keywords

ANALYTICAL TOOL; CLOSED CONTOURS; FRACTOGRAPHS; FRACTURE SURFACES; IMAGE PROCESSING TECHNIQUE; IMAGE PROCESSING TOOLS; MATERIAL SCIENCE; QUANTITATIVE ANALYSIS; QUANTITATIVE FRACTOGRAPHY; SCANNING ELECTRON MICROSCOPES; SEM; SURFACE/VOID BOUNDARY EXTRACTION; VOID DISTRIBUTIONS;

FRACTOGRAPHY; FRACTURE; FRACTURE MECHANICS; IMAGE PROCESSING; IMAGING SYSTEMS; INFORMATION TECHNOLOGY; SCANNING ELECTRON MICROSCOPY;

SURFACES;

EID: 79953852831     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EAIT.2011.20     Document Type: Conference Paper

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