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Volumn , Issue , 2011, Pages 268-271

Heterogeneous integration technology for combination of different wafer sizes using an expandable handle substrate

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE WAFER BONDING; BATCH TRANSFER; EVALUATION METHOD; HETEROGENEOUS INTEGRATION; MATRIX; NOVEL METHODS; POSITIONING ACCURACY; STANDARD DEVIATION; WAFER SIZES; WAFER SUBSTRATES;

EID: 79953802096     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2011.5734413     Document Type: Conference Paper
Times cited : (8)

References (5)
  • 1
    • 71449090160 scopus 로고    scopus 로고
    • High-performance quantum-well silicon-germanium bolometers using IC-compatible integration for low-cost imagers
    • Denver, USA
    • F. Forsberg, N. Roxhed, P. Ericsson, S. Wissmar, F. Niklaus, G. Stemme, "High-performance quantum-well silicon-germanium bolometers using IC-compatible integration for low-cost imagers", Proc. Transducers 2009, pp.2214-2217, Denver, USA.
    • (2009) Proc. Transducers , pp. 2214-2217
    • Forsberg, F.1    Roxhed, N.2    Ericsson, P.3    Wissmar, S.4    Niklaus, F.5    Stemme, G.6
  • 2
    • 10944220860 scopus 로고    scopus 로고
    • Wafer-scale microdevice transfer/interconnect: Its application in an AFM-based data-storage system
    • DOI 10.1109/JMEMS.2004.835769
    • M. Despont, U. Drechsler, R. Yu, H.B Pogge, P. Vettiger, "Wafer-scale microdevice transfer/interconnect: its application in an AFM-based data-storage system", Journal of Microelectromechanical Systems, Vol.13, No.6, pp.895-901, 2004. (Pubitemid 40009490)
    • (2004) Journal of Microelectromechanical Systems , vol.13 , Issue.6 , pp. 895-901
    • Despont, M.1    Drechsler, U.2    Yu, R.3    Pogge, H.B.4    Vettiger, P.5
  • 3
    • 40449127443 scopus 로고    scopus 로고
    • Selective transfer technology for microdevice distribution
    • DOI 10.1109/JMEMS.2007.911370
    • R. Guerre, U. Drechsler, D. Jubin, M. Despont, "Selective transfer technology for microdevice distribution", IEEE Journal of Microelectromechanical Systems, Vol.17, No.1, pp.157-165, 2008. (Pubitemid 351343929)
    • (2008) Journal of Microelectromechanical Systems , vol.17 , Issue.1 , pp. 157-165
    • Guerre, R.1    Drechsler, U.2    Jubin, D.3    Despont, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.