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Volumn 98, Issue 13, 2011, Pages

Residual and nitrogen doping of homoepitaxial nonpolar m -plane ZnO films grown by molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

COMPENSATION MECHANISM; DOPED ZNO; HIGH PURITY; HIGH QUALITY; HOMOEPITAXIAL; HOMOEPITAXIAL GROWTH; N-TYPE DOPING; NITROGEN-DOPING; NONPOLAR M-PLANE; P-TYPE DOPING; RESIDUAL DOPING; TEMPERATURE RANGE; ZNO; ZNO FILMS;

EID: 79953753191     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3572025     Document Type: Article
Times cited : (50)

References (20)
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    • Wang, L.G.1    Zunger, A.2
  • 9
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    • (2006) J. Appl. Phys. , vol.99 , pp. 124307
    • Matsui, H.1    Tabata, H.2
  • 12
    • 18244430368 scopus 로고    scopus 로고
    • 0031-9007, 10.1103/PhysRevLett.85.1012
    • C. G. Van de Walle, Phys. Rev. Lett. 0031-9007 85, 1012 (2000). 10.1103/PhysRevLett.85.1012
    • (2000) Phys. Rev. Lett. , vol.85 , pp. 1012
    • Van De Walle, C.G.1
  • 13
    • 41349116132 scopus 로고    scopus 로고
    • Origin of conductive surface layer in annealed ZnO
    • DOI 10.1063/1.2903505
    • D. C. Look, B. Claflin, and H. E. Smith, Appl. Phys. Lett. 0003-6951 92, 122108 (2008). 10.1063/1.2903505 (Pubitemid 351451642)
    • (2008) Applied Physics Letters , vol.92 , Issue.12 , pp. 122108
    • Look, D.C.1    Claflin, B.2    Smith, H.E.3
  • 14
    • 79953758152 scopus 로고    scopus 로고
    • Evans analytical group: Application note No. 246: SIMS detection limits of selected elements in ZnO under normal depth profiling conditions
    • Evans analytical group: Application note No. 246: SIMS detection limits of selected elements in ZnO under normal depth profiling conditions, www.http://www.eaglabs.com/fisles/appnotes/.
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.