Internal electron emission in metal-insulator-metal thin film tunnel devices bombarded with keV argon and gold-cluster projectiles

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 9, 2011, Pages 972-976

  Marpe, Mario ^a   Heuser, Christian ^a   Diesing, Detlef ^a   Wucher, Andreas ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Cluster bombardment; Internal electron emission; Kinetic electron emission; Kinetic excitation; Vicinage effect

Indexed keywords

CLUSTER BOMBARDMENT; INTERNAL ELECTRON EMISSION; KINETIC ELECTRON EMISSION; KINETIC EXCITATION; VICINAGE EFFECT;

ARGON; ELECTRONS; GOLD COMPOUNDS; ION BOMBARDMENT; IONS; METAL INSULATOR BOUNDARIES; METALS; MIM DEVICES; PROJECTILES; SEMICONDUCTOR INSULATOR BOUNDARIES;

ELECTRON EMISSION;

EID: 79953739209     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.12.045     Document Type: Conference Paper

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