Microstructure and properties of high-temperature materials (1-x) Na 0.5Bi2.5Nb2O9-xLiNbO3

Journal of the American Ceramic Society

Volumn 94, Issue 4, 2011, Pages 1109-1113

  Jiang, Xiang Ping ^a   Yang, Qing ^a   Zhou, Shu Lan ^a   Chen, Chao ^a   Chen, Yan ^b   Tu, Na ^a   Yu, Zu Deng ^a  

^a JINGDEZHEN CERAMIC INSTITUTE   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

AGING STUDIES; BISMUTH LAYER-STRUCTURED FERROELECTRICS; BISMUTH OXIDES; ELECTRICAL PROPERTY; HIGH-TEMPERATURE MATERIALS; LAYERED STRUCTURES; MAXIMUM VALUES; MECHANICAL QUALITY FACTORS; MICROSTRUCTURE AND PROPERTIES; PIEZOELECTRIC CONSTANT; PIEZOELECTRIC PROPERTY; REMANENT POLARIZATION; THERMAL-ANNEALING;

BISMUTH; CURIE TEMPERATURE; DIELECTRIC LOSSES; FERROELECTRIC CERAMICS; MICROSTRUCTURE; PIEZOELECTRICITY; SODIUM;

ELECTRIC PROPERTIES;

EID: 79953678100     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04219.x     Document Type: Article

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