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Volumn 109, Issue 6, 2011, Pages

Geometric confinement effects on the metal-insulator transition temperature and stress relaxation in VO2 thin films grown on silicon

(4) Viswanath, B a Changhyun, Ko a Yang, Zheng a Ramanathan, Shriram a

a HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITED; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; GEOMETRIC CONFINEMENT; IN-SITU; INTERFACIAL LAYER; METAL INSULATOR TRANSITION TEMPERATURE; MICRO-STRUCTURAL; NANO SCALE; OPTICAL TRANSMITTANCE; RESISTANCE RATIO; SI SUBSTRATES; SI(1 0 0); STRESS CHANGES; TUNABILITIES; VANADIUM OXIDE LAYERS;

HAFNIUM COMPOUNDS; METAL INSULATOR BOUNDARIES; METALS; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR INSULATOR BOUNDARIES; SINGLE CRYSTALS; SOLID STATE DEVICES; SUBSTRATES; TEMPERATURE; TEMPERATURE MEASUREMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

METAL INSULATOR TRANSITION;

EID: 79953653367 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3556756 Document Type: Article

Times cited : (29)

References (31)

1
- 4244014869
- 10.1103/PhysRevLett.3.34
- F. J. Morin, Phys. Rev. Lett. 3, 34 (1959). 10.1103/PhysRevLett.3.34
- (1959) Phys. Rev. Lett. , vol.3 , pp. 34
- Morin, F.J.¹

2
- 2242443246
- 10.1103/PhysRevLett.17.1286
- A. S. Barker, H. W. Verleur, and H. J. Guggenheim, Phys. Rev. Lett. 17, 1286 (1966). 10.1103/PhysRevLett.17.1286
- (1966) Phys. Rev. Lett. , vol.17 , pp. 1286
- Barker, A.S.¹ Verleur, H.W.² Guggenheim, H.J.³

3
- 0034295232
- 2
- DOI 10.1088/0953-8984/12/41/310
- G. Stefanovich, A. Pergament, and D. Stefanovich, J. Phys. Condens. Matter. 12, 8837 (2000). 10.1088/0953-8984/12/41/310 (Pubitemid 32027255)
- (2000) Journal of Physics Condensed Matter , vol.12 , Issue.41 , pp. 8837-8845
- Stefanovich, G.¹ Pergament, A.² Stefanovich, D.³

4
- 77950296471
- 10.1016/j.sse.2010.01.006
- S. Hormoz and S. Ramanathan, Solid State Electron. 54, 654 (2010). 10.1016/j.sse.2010.01.006
- (2010) Solid State Electron. , vol.54 , pp. 654
- Hormoz, S.¹ Ramanathan, S.²

5
- 36549076423
- Rf-microwave switches based on reversible semiconductor-metal transition of v O2 thin films synthesized by pulsed-laser deposition
- DOI 10.1063/1.2815927
- F. Dumas-Bouchiat, C. Champeaux, A. Catherinot, A. Crunteanu, and P. Blondy, Appl. Phys. Lett. 91, 223505-3-(2007). 10.1063/1.2815927 (Pubitemid 350191672)
- (2007) Applied Physics Letters , vol.91 , Issue.22 , pp. 223505
- Dumas-Bouchiat, F.¹ Champeaux, C.² Catherinot, A.³ Crunteanu, A.⁴ Blondy, P.⁵

6
- 70349679290
- 10.1364/OE.17.018330
- M. J. Dicken, K. Aydin, I. M. Pryce, L. A. Sweatlock, E. M. Boyd, S. Walavalkar, J. Ma, and H. A. Atwater, Opt. Express. 17, 18330 (2009). 10.1364/OE.17.018330
- (2009) Opt. Express. , vol.17 , pp. 18330
- Dicken, M.J.¹ Aydin, K.² Pryce, I.M.³ Sweatlock, L.A.⁴ Boyd, E.M.⁵ Walavalkar, S.⁶ Ma, J.⁷ Atwater, H.A.⁸

7
- 66849084079
- 10.1021/nl900676n
- E. Strelcov, Y. Lilach, and A. Kolmakov, Nano Lett. 9, 2322 (2009). 10.1021/nl900676n
- (2009) Nano Lett. , vol.9 , pp. 2322
- Strelcov, E.¹ Lilach, Y.² Kolmakov, A.³

8
- 71949102050
- 10.1021/nl902020t
- J. M. Baik, M. H. Kim, C. Larson, C. T. Yavuz, G. D. Stucky, A. M. Wodtke, and M. Moskovits, Nano. Lett. 9, 3980 (2009). 10.1021/nl902020t
- (2009) Nano. Lett. , vol.9 , pp. 3980
- Baik, J.M.¹ Kim, M.H.² Larson, C.³ Yavuz, C.T.⁴ Stucky, G.D.⁵ Wodtke, A.M.⁶ Moskovits, M.⁷

9
- 71949117029
- 10.1021/nl9028973
- S. Zhang, J. Y. Chou, and L. J. Lauhon, Nano. Lett. 9, 4527 (2009). 10.1021/nl9028973
- (2009) Nano. Lett. , vol.9 , pp. 4527
- Zhang, S.¹ Chou, J.Y.² Lauhon, L.J.³

10
- 33750516916
- 2 nanobeams
- DOI 10.1021/nl061831r
- J. Wu, Q. Gu, B. S. Guiton, N. P. de Leon, L. Ouyang, and H. Park, Nano. Lett. 6, 2313 (2006). 10.1021/nl061831r (Pubitemid 44663824)
- (2006) Nano Letters , vol.6 , Issue.10 , pp. 2313-2317
- Wu, J.¹ Gu, Q.² Guiton, B.S.³ De Leon, N.P.⁴ Ouyang, L.⁵ Park, H.⁶

11
- 77950509043
- 10.1063/1.3380599
- T. Kikuzuki and M. Lippmaa, Appl. Phys. Lett. 96, 132107 (2010). 10.1063/1.3380599
- (2010) Appl. Phys. Lett. , vol.96 , pp. 132107
- Kikuzuki, T.¹ Lippmaa, M.²

12
- 0141457039
- 10.1063/1.120469
- J. M. Gregg and R. M. Bowman, Appl. Phys. Lett. 71, 3649 (1997). 10.1063/1.120469
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3649
- Gregg, J.M.¹ Bowman, R.M.²

13
- 77955336129
- 10.1021/nl101457k
- J. Cao, Y. Gu, W. Fan, L. Q. Chen, D. F. Ogletree, K. Chen, N. Tamura, M. Kunz, C. Barrett, J. Seidel, and J. Wu, Nano. Lett. 10, 2667 (2010). 10.1021/nl101457k
- (2010) Nano. Lett. , vol.10 , pp. 2667
- Cao, J.¹ Gu, Y.² Fan, W.³ Chen, L.Q.⁴ Ogletree, D.F.⁵ Chen, K.⁶ Tamura, N.⁷ Kunz, M.⁸ Barrett, C.⁹ Seidel, J.¹⁰ Wu, J.¹¹

14
- 58149229129
- 10.1063/1.3058769
- L. Jiwei, G. W. Kevin, and A. W. Stuart, Appl. Phy. Lett. 93, 262107 (2008). 10.1063/1.3058769
- (2008) Appl. Phy. Lett. , vol.93 , pp. 262107
- Jiwei, L.¹ Kevin, G.W.² Stuart, A.W.³

15
- 79956019110
- 2 (001) and (110) substrates
- DOI 10.1063/1.1446215
- Y. Muraoka and Z. Hiroi, Appl. Phys. Lett. 80, 583 (2002). 10.1063/1.1446215 (Pubitemid 34148239)
- (2002) Applied Physics Letters , vol.80 , Issue.4 , pp. 583
- Muraoka, Y.¹ Hiroi, Z.²

16
- 70449567721
- 10.1038/nnano.2009.266
- J. Cao, E. Ertekin, V. Srinivasan, W. Fan, S. Huang, H. Zheng, J. W. L. Yim, D. R. Khanal, D. F. Ogletree, J. C. Grossman, and J. Wu, Nat. Nanotechnol. 4, 732 (2009). 10.1038/nnano.2009.266
- (2009) Nat. Nanotechnol. , vol.4 , pp. 732
- Cao, J.¹ Ertekin, E.² Srinivasan, V.³ Fan, W.⁴ Huang, S.⁵ Zheng, H.⁶ Yim, J.W.L.⁷ Khanal, D.R.⁸ Ogletree, D.F.⁹ Grossman, J.C.¹⁰ Wu, J.¹¹

17
- 77953319798
- 10.1021/nl1008794
- A. Tselev, E. Strelcov, I. A. Lukyanchuk, J. D. Budai, J. Z. Tischler, I. N. Ivanov, K. Jones, R. Proksch, S. V. Kalinin, and A. Kolmakov, Nano. Lett. 10, 2003 (2010). 10.1021/nl1008794
- (2010) Nano. Lett. , vol.10 , pp. 2003
- Tselev, A.¹ Strelcov, E.² Lukyanchuk, I.A.³ Budai, J.D.⁴ Tischler, J.Z.⁵ Ivanov, I.N.⁶ Jones, K.⁷ Proksch, R.⁸ Kalinin, S.V.⁹ Kolmakov, A.¹⁰

18
- 67649666754
- 10.1021/ja902054w
- L. Whittaker, C. Jaye, Z. Fu, D. A. Fischer, and S. Banerjee, J. Am. Chem. Soc. 131, 8884 (2009). 10.1021/ja902054w
- (2009) J. Am. Chem. Soc. , vol.131 , pp. 8884
- Whittaker, L.¹ Jaye, C.² Fu, Z.³ Fischer, D.A.⁴ Banerjee, S.⁵

19
- 71949095612
- 10.1021/nl900841k
- J. I. Sohn, H. J. Joo, D. Ahn, H. H. Lee, A. E. Porter, K. Kim, D. J. Kang, and M. E. Welland, Nano. Lett. 9, 3392 (2009). 10.1021/nl900841k
- (2009) Nano. Lett. , vol.9 , pp. 3392
- Sohn, J.I.¹ Joo, H.J.² Ahn, D.³ Lee, H.H.⁴ Porter, A.E.⁵ Kim, K.⁶ Kang, D.J.⁷ Welland, M.E.⁸

20
- 2342629966
- 10.1016/j.sna.2004.02.019
- Y. Fu, H. Du, W. Huang, S. Zhang, and M. Hu, Sensors Actuators A: Phys. 112, 395 (2004). 10.1016/j.sna.2004.02.019
- (2004) Sensors Actuators A: Phys. , vol.112 , pp. 395
- Fu, Y.¹ Du, H.² Huang, W.³ Zhang, S.⁴ Hu, M.⁵

21
- 69149088688
- 10.1063/1.3186024
- C. Ko and S. Ramanathan, J. Appl. Phys. 106, 034101 (2009). 10.1063/1.3186024
- (2009) J. Appl. Phys. , vol.106 , pp. 034101
- Ko, C.¹ Ramanathan, S.²

22
- 21044444062
- 2 gate insulators with in situ annealing studied by valence-band photoemission and x-ray absorption spectroscopy
- DOI 10.1063/1.1899228, 104507
- S. Toyoda, J. Okabayashi, H. Kumigashira, M. Oshima, K. Yamashita, M. Niwa, K. Usuda, and G. L. Liu, J. Appl. Phys. 97, 104507 (2005). 10.1063/1.1899228 (Pubitemid 40870949)
- (2005) Journal of Applied Physics , vol.97 , Issue.10 , pp. 1-4
- Toyoda, S.¹ Okabayashi, J.² Kumigashira, H.³ Oshima, M.⁴ Yamashita, K.⁵ Niwa, M.⁶ Usuda, K.⁷ Liu, G.L.⁸

23
- 1942540819
- 10.1063/1.1667621
- H. Kim, A. Marshall, P. C. McIntyre, and K. C. Saraswat, Appl. Phys. Lett. 84, 2064 (2004). 10.1063/1.1667621
- (2004) Appl. Phys. Lett. , vol.84 , pp. 2064
- Kim, H.¹ Marshall, A.² McIntyre, P.C.³ Saraswat, K.C.⁴

24
- 77951609796
- 10.1063/1.3369282
- R. Armando, E. F. Felix, and S. Nelson, J. Appl. Phys. 107, 074506 (2010). 10.1063/1.3369282
- (2010) J. Appl. Phys. , vol.107 , pp. 074506
- Armando, R.¹ Felix, E.F.² Nelson, S.³

25
- 0036906760
- 10.10 02/1521-388 9(2002 10)11:9650::AID-AND P6503.0.CO;2-K
- V. Eyert, Ann. Phys. 11, 650 (2002). 10.1002/1521-3889(200210)11:9650:: AID-ANDP6503.0.CO;2-K
- (2002) Ann. Phys. , vol.11 , pp. 650
- Eyert, V.¹

26
- 0001719199
- 10.1103/PhysRevB.5.2541
- M. Marezio, D. B. McWhan, J. P. Remeika, and P. D. Dernier, Phys. Rev. B Condens. Matter Mater. Phys. 5, 2541 (1972). 10.1103/PhysRevB.5.2541
- (1972) Phys. Rev. B Condens. Matter Mater. Phys. , vol.5 , pp. 2541
- Marezio, M.¹ McWhan, D.B.² Remeika, J.P.³ Dernier, P.D.⁴

27
- 6444243876
- 10.1557/JMR.2004.0385
- L. Bo-Kuai, H. Kahn, S. M. Phillips, Z. Akase, and A. H. Heuer, J. Mater. Res. 19, 2822 (2004). 10.1557/JMR.2004.0385
- (2004) J. Mater. Res. , vol.19 , pp. 2822
- Bo-Kuai, L.¹ Kahn, H.² Phillips, S.M.³ Akase, Z.⁴ Heuer, A.H.⁵

28
- 3242739528
- 10.1063/1.1762995
- J. Y. Suh, R. Lopez, L. C. Feldman, and R. F. Haglund Jr., J. Appl. Phys. 96, 1209 (2004). 10.1063/1.1762995
- (2004) J. Appl. Phys. , vol.96 , pp. 1209
- Suh, J.Y.¹ Lopez, R.² Feldman, L.C.³ Haglund Jr., R.F.⁴

29
- 0036612529
- 10.1103/PhysRevB.65.224113
- R. Lopez, T. E. Haynes, L. A. Boatner, L. C. Feldman, and R. F. Haglund, Phys. Rev. B: Condens. Matter Mater. Phys. 65, 224113 (2002). 10.1103/PhysRevB.65.224113
- (2002) Phys. Rev. B: Condens. Matter Mater. Phys. , vol.65 , pp. 224113
- Lopez, R.¹ Haynes, T.E.² Boatner, L.A.³ Feldman, L.C.⁴ Haglund, R.F.⁵

30
- 38849172466
- 2 thin films
- DOI 10.1016/j.sna.2007.05.002, PII S0924424707003780
- J. Lappalainen, S. Heinilehto, S. Saukko, V. Lantto, and H. Jantunen, Sens. Actuators. A. 142, 250 (2008). 10.1016/j.sna.2007.05.002 (Pubitemid 351199590)
- (2008) Sensors and Actuators, A: Physical , vol.142 , Issue.1 , pp. 250-255
- Lappalainen, J.¹ Heinilehto, S.² Saukko, S.³ Lantto, V.⁴ Jantunen, H.⁵

31
- 65249184375
- 10.1021/nl8031839
- E. U. Donev, R. Lopez, L. C. Feldman, and R. F. Haglund, Nano. Lett. 9, 702 (2009). 10.1021/nl8031839
- (2009) Nano. Lett. , vol.9 , pp. 702
- Donev, E.U.¹ Lopez, R.² Feldman, L.C.³ Haglund, R.F.⁴

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