Decay pathways after Xe 3d inner shell ionization using a multi-electron coincidence technique

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 44, Issue 7, 2011, Pages

  Suzuki, I H ^a   Hikosaka, Y ^b   Shigemasa, E ^c   Lablanquie, P ^d,e   Penent, F ^d,e   Soejima, K ^b   Nakano, M ^a,f   Kouchi, N ^f   Ito, K ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b NIIGATA UNIVERSITY   (Japan)

^c INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^d SORBONNE UNIVERSITÉ   (France)

^e CNRS   (France)

^f TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER DECAYS; AUGER ELECTRON; AUGER ELECTRON EMISSIONS; CASCADE PROCESS; CHARGED STATE; COINCIDENCE TECHNIQUES; ELECTRON SPECTROMETER; INNER-SHELL IONIZATION; MULTI-ELECTRON;

AUGERS; COINCIDENCE CIRCUITS; IONIZATION; MAGNETIC MIRRORS;

ELECTRONS;

EID: 79953652549     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/44/7/075003     Document Type: Article

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