SCOPUS 정보 검색 플랫폼

Volumn 605, Issue 9-10, 2011, Pages 889-897

Measuring concentration depth profiles at liquid surfaces: Comparing angle resolved X-ray photoelectron spectroscopy and neutral impact collision scattering spectroscopy

(2) Wang, Chuangye a Andersson, Gunther G a,b

a UNIVERSITY OF LEIPZIG (Germany)

b FLINDERS UNIVERSITY (Australia)

Author keywords

Angle resolved X ray photoelectron spectroscopy; Concentration depth profiles; Liquid surfaces; Neutral impact collision ion scattering spectroscopy

Indexed keywords

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; ANION CONCENTRATIONS; CATION CONCENTRATIONS; CONCENTRATION DEPTH PROFILES; CONCENTRATION-DEPTH PROFILE; FORMAMIDES; HELIUM ION; IONIC SURFACTANTS; LIQUID SURFACE; LIQUID SURFACES; NEUTRAL IMPACT COLLISION; NEUTRAL IMPACT COLLISION ION SCATTERING SPECTROSCOPY; POLAR SOLVENTS; PROJECTILE ENERGY; SCATTERING SPECTROSCOPY; SURFACE EXCESS; X-RAY SOURCES;

AMIDES; BROMINE COMPOUNDS; CONCENTRATION (PROCESS); ELECTRONS; HELIUM; HIGH ENERGY PHYSICS; IONS; LIQUIDS; PHOTOELECTRICITY; PHOTONS; PLASMA INTERACTIONS; PROJECTILES; SCATTERING; SURFACE ACTIVE AGENTS; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79953277449 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2011.01.035 Document Type: Article

Times cited : (20)

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