Understanding the ultrawideband channel characteristics within a computer chassis

IEEE Antennas and Wireless Propagation Letters

Volumn 10, Issue , 2011, Pages 191-194

  Redfield, Stephen ^a   Woracheewan, Sirikarn ^a   Liu, Huaping ^a   Chiang, Patrick ^a   Nejedlo, Jay ^b   Khanna, Rahul ^b  

^a Oregon State University   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Near and far field propagation; statistical channel model; ultrawideband (UWB)

Indexed keywords

BREAKPOINT; CHANNEL IMPULSE RESPONSE; CLUSTER DECAY; CPU CLOCKS; ELECTROMAGNETIC INTERFERENCE; FAR-FIELD; FULLY OPERATIONAL; INTERFERENCE SOURCES; MEASUREMENT DATA; MEASUREMENT-BASED; NEAR-FIELD; NUMBER OF CLUSTERS; PATH-LOSS MODEL; SHORT-RANGE COMMUNICATION; STATISTICAL CHANNEL MODEL; ULTRA-WIDEBAND CHANNELS; ULTRAWIDE-BAND CHANNEL MODELS;

ELECTROMAGNETIC PULSE; IMPULSE RESPONSE;

CHASSIS;

EID: 79953231627     PISSN: 15361225     EISSN: None     Source Type: Journal    
DOI: 10.1109/LAWP.2011.2118731     Document Type: Article

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