Improved design of robust exponentially weighted moving average control charts for autocorrelated processes

Quality and Reliability Engineering International

Volumn 27, Issue 3, 2011, Pages 337-352

  Lee, Hyun Cheol ^a   Apley, Daniel W ^b  

^a SAMSUNG Electronics   (South Korea)

^b Northwestern University   (United States)

Author keywords

autoregressive moving average models; exponentially weighted moving average; model uncertainty; residual based control charts; robust design; time series

Indexed keywords

AUTO-REGRESSIVE MOVING AVERAGE MODEL; EXPONENTIALLY WEIGHTED MOVING AVERAGE; MODEL UNCERTAINTY; RESIDUAL-BASED CONTROL CHARTS; ROBUST DESIGNS;

COVARIANCE MATRIX; DESIGN; ERRORS; FLOWCHARTING; GRAPHIC METHODS; TIME SERIES; UNCERTAINTY ANALYSIS;

PROCESS CONTROL;

EID: 79953209739     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1126     Document Type: Article

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