The joint economic-statistical design of X and R charts for nonnormal data

Quality and Reliability Engineering International

Volumn 27, Issue 3, 2011, Pages 269-280

  Chen, Huifen ^a   Pao, Yikung ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

economic statistical design; Johnson distribution; R chart; Weibull distribution; X chart

Indexed keywords

CONTROL CHARTS; HIGHER ORDER STATISTICS; QUALITY CONTROL; SENSITIVITY ANALYSIS;

ECONOMIC STATISTICAL DESIGN; JOHNSON DISTRIBUTION; OPTIMAL DESIGN PARAMETERS; QUALITY MEASUREMENTS; R CHART; TYPE I AND II ERRORS; WEIBULL SCALE PARAMETERS; X-CHARTS;

WEIBULL DISTRIBUTION;

EID: 79953188383     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1116     Document Type: Article

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