Forensic analysis of tempered sheet glass by particle induced X-ray emission (PIXE)

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 10, 2011, Pages 1067-1070

  Jisonna, L J ^a   Deyoung, P A ^a   Ferens, J ^a   Hall, C ^a   Lunderberg, J M ^a   Mears, P ^a   Padilla, D ^b   Peaslee, G F ^a   Sampson, R ^c  

^a HOPE COLLEGE   (United States)

^b SAN DIEGO STATE UNIVERSITY   (United States)

^c Columbia University ^*  (United States)

Author keywords

Forensic trace element analysis; Glass; ICP AES; Ion beam analysis; Nondestructive; PIXE

Indexed keywords

ICP-AES; ION BEAM ANALYSIS; NON DESTRUCTIVE; PIXE; TRACE ELEMENT ANALYSIS;

ATOMIC EMISSION SPECTROSCOPY; ELECTROMAGNETIC INDUCTION; ELECTROMAGNETIC WAVE EMISSION; GLASS; HYDROFLUORIC ACID; INDUCTIVELY COUPLED PLASMA; ION BEAMS; MANGANESE; SPECTROMETRY; STRONTIUM; TITANIUM; TRACE ANALYSIS; X RAY SCATTERING;

TRACE ELEMENTS;

EID: 79953095067     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.02.079     Document Type: Article

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