Computational nano-optic technology based on discrete sources method

Journal of Modern Optics

Volumn 58, Issue 5-6, 2011, Pages 384-399

  Eremina, Elena ^a   Eremin, Yuri ^b   Wriedt, Thomas ^c  

^a UNIVERSITY OF BREMEN   (Germany)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c STIFTUNG INSTITUT FÜR WERKSTOFFTECHNIK   (Germany)

Author keywords

discrete sources method; extreme transmission effect; light scattering; mathematical modeling; nanostructure; total internal reflection microscopy

Indexed keywords

ANALYSIS AND CHARACTERIZATION; DISCRETE SOURCES METHOD; EXTREME TRANSMISSION EFFECT; FUNCTIONAL ABILITIES; FUNCTIONAL PROPERTIES; LAYERED STRUCTURES; MATHEMATICAL MODELING; NANOOPTICS; SYSTEM PROPERTY; TECHNOLOGY-BASED; TOTAL INTERNAL REFLECTION MICROSCOPY;

COMPUTATIONAL METHODS; LIGHT; LIGHT REFLECTION; LIGHT SCATTERING; LIGHT TRANSMISSION; MATHEMATICAL MODELS; NANOPHOTONICS; NANOSTRUCTURES; REFRACTION; REFRACTIVE INDEX; SCATTERING;

COMPUTER SIMULATION;

EID: 79953084208     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340.2010.515751     Document Type: Article

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