![]() |
Volumn 26, Issue 4, 2011, Pages 845-851
|
Precise U-Pb zircon dating at a scale of <5 micron by the CAMECA 1280 SIMS using a Gaussian illumination probe
|
Author keywords
[No Author keywords available]
|
Indexed keywords
A-SPOTS;
BEAM INTENSITY;
CHEMICAL FEATURES;
GAUSSIAN MODES;
GAUSSIANS;
GEOSCIENCES;
IN-SITU;
JURASSIC;
LATERAL RESOLUTION;
M-SCALE;
OXYGEN FLOODING;
PRIMARY BEAMS;
SECONDARY IONS;
SPATIAL RESOLUTION;
TARGET SURFACE;
TRADE OFF;
U-PB AGES;
U-PB DATING;
U-PB GEOCHRONOLOGY;
U-PB ZIRCON;
ZIRCON CRYSTALS;
GAUSSIAN BEAMS;
IONS;
OPTIMIZATION;
OXYGEN;
PROBES;
SECONDARY EMISSION;
SECONDARY ION MASS SPECTROMETRY;
SILICATE MINERALS;
ZIRCON;
GEOCHRONOLOGY;
|
EID: 79953041386
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/c0ja00113a Document Type: Conference Paper |
Times cited : (71)
|
References (21)
|