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Volumn 78, Issue 5, 2011, Pages 1476-1481
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Temperature dependent crystallographic transformations in chalcedony, SiO2, assessed in mid infrared spectroscopy
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Author keywords
555 cm 1 band; Chalcedony; Flint; FT IR; SiOH; Surface silanole
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Indexed keywords
555 CM-1 BAND;
CHALCEDONY;
FLINT;
FT-IR;
SIOH;
CRYSTALLITES;
FOURIER TRANSFORMS;
HEATING;
INFRARED SPECTROSCOPY;
QUARTZ;
SILICON COMPOUNDS;
SILICON;
HYDROXYL RADICAL;
SILICON;
SILICON DIOXIDE;
ABSORPTION;
ARTICLE;
CHEMISTRY;
INFRARED SPECTROPHOTOMETRY;
METHODOLOGY;
NEAR INFRARED SPECTROSCOPY;
TEMPERATURE;
X RAY CRYSTALLOGRAPHY;
ABSORPTION;
CRYSTALLOGRAPHY, X-RAY;
HYDROXYL RADICAL;
SILICON;
SILICON DIOXIDE;
SPECTROPHOTOMETRY, INFRARED;
SPECTROSCOPY, NEAR-INFRARED;
TEMPERATURE;
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EID: 79953027390
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2011.01.036 Document Type: Article |
Times cited : (39)
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References (18)
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