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Volumn 22, Issue 17, 2011, Pages

Force scanning: A rapid, high-resolution approach for spatial mechanical property mapping

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AGAROSE GEL; ARTICULAR CARTILAGES; FORCE CURVE; FORCE MAPPING; HIGH RESOLUTION; INDIVIDUAL CELLS; LOW RESOLUTION; MAPPING TECHNIQUES; MICRO-SCALES; MODULUS MAPPING; NANO SCALE; REGION OF INTEREST; SCANNING TECHNIQUES; SPECIALIZED SOFTWARE; TESTING ENVIRONMENT; TOPOGRAPHICAL FEATURES; TOPOGRAPHICAL IMAGES; TORSIONAL OSCILLATION;

EID: 79952957085     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/17/175707     Document Type: Article
Times cited : (39)

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