Q-stack aging model for face verification

European Signal Processing Conference

Volumn , Issue , 2009, Pages 65-69

  Drygajlo, Andrzej ^a   Li, Weifeng ^a   Zhu, Kewei ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AGE PROGRESSION; AGING MODELS; BIOMETRIC FEATURES; CLASSIFICATION MODELS; ERROR RATE; FACE IMAGES; FACE VERIFICATION; IDENTITY VERIFICATION; METADATA QUALITY; PHYSICAL CHARACTERISTICS; RESEARCH PROBLEMS; SIGNAL QUALITY;

BIOMETRICS; METADATA;

SIGNAL PROCESSING;

EID: 79952928520     PISSN: 22195491     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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