Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Volumn , Issue , 2010, Pages

  Sami, A ^a   David, E ^a   Frechette M ^b  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

^b HYDRO QUÉBEC   (Canada)

Author keywords

Crystallinity; HDPE LDPE; Nanocomposites materials; SiO2; X ray diffraction

Indexed keywords

CRYSTALLINE ORDER; CRYSTALLINE PEAKS; CRYSTALLINE SAMPLES; CRYSTALLINITIES; DIFFRACTION DATA; HDPE / LDPE; LOW DENSITY; MELT-COMPOUNDING; SIO2; TWIN SCREW EXTRUDERS;

CRYSTALLINE MATERIALS; DIFFRACTION PATTERNS; INTERFEROMETRY; SILICON COMPOUNDS; X RAY DIFFRACTION; X RAYS;

NANOCOMPOSITES;

EID: 79952923501     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEIDP.2010.5724069     Document Type: Conference Paper

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