Characterization of the effects of silicon on the formation of goethite

Corrosion Science

Volumn 53, Issue 5, 2011, Pages 1756-1761

  Mejia Gomez J A ^a,b   de Resende, V G ^a   Antonissen, J ^b   De Grave, E ^a  

^a GHENT UNIVERSITY   (Belgium)

^b Arcelor Mittal Research Industry Gent (ARIG)   (Belgium)

Author keywords

A. Goethite; A. Silicon; C. Characterization; C. Growth inhibition; C. Particle size

Indexed keywords

A. GOETHITE; A. SILICON; C. CHARACTERIZATION; C. GROWTH INHIBITION; C. PARTICLE SIZE;

INDUCTIVELY COUPLED PLASMA; PARTICLE SIZE; SILICATES; SODIUM; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;

EID: 79952897774     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2011.01.053     Document Type: Article

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