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Volumn 82, Issue , 2011, Pages 25-46

Measuring and Monitoring Technical Debt

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EID: 79952799302     PISSN: 00652458     EISSN: None     Source Type: Book Series    
DOI: 10.1016/B978-0-12-385512-1.00002-5     Document Type: Book
Times cited : (193)

References (33)
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    • An Incremental Technique to Pay off Testing Technical Debt. Available:
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    • Comparing high-change modules and modules with the highest measurement values in two large-scale open-source products
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.