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Thin Solid Films

Volumn 519, Issue 11, 2011, Pages 3752-3755

Growth, structure and electronic properties of ultrathin cerium oxide films grown on Pt(111)

(4) Breinlich, Christian a Essen, Jan Markus a Barletta, Enrico a Wandelt, Klaus a

a UNIVERSITY OF BONN (Germany)

Author keywords

Ceria; Cerium; Platinum; Scanning tunneling microscopy; Scanning Tunneling Spectroscopy; Ultrathin oxide films

Indexed keywords

BAND GAPS; CERIA; CERIUM OXIDES; DIFFRACTION DATA; ELECTRON ENERGIES; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; PHONON SPECTRUM; PT(111); SCANNING TUNNELING SPECTROSCOPY; SURFACE ALLOYS; ULTRA-THIN; ULTRATHIN OXIDE FILMS;

CERIUM; CERIUM COMPOUNDS; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ENERGY DISSIPATION; HIGH RESOLUTION ELECTRON MICROSCOPY; OXIDES; PLATINUM; SCANNING; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; ULTRATHIN FILMS;

OXIDE FILMS;

EID: 79952740166 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.01.353 Document Type: Article

Times cited : (11)

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