Flux growth and characterization of Gd2GeMoO8 and Yb3:Gd2GeMoO8 crystals

Journal of Crystal Growth

Volumn 318, Issue 1, 2011, Pages 991-994

  Xu, Lan ^a,b   Zhang, Qing Li ^a   Zhou, Wen Long ^a,b   Ding, Li Hua ^a,b   Yin, Shao Tang ^a  

^a ANHUI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

A1. Absorption spectrum; A1. Photoluminescence; A1. Structure; A1. X ray diffraction; A2. Growth from solutions; B1. Yb3:Gd2GeMoO 8

Indexed keywords

A1. ABSORPTION SPECTRUM; A1. PHOTOLUMINESCENCE; A1. STRUCTURE; A1. X-RAY DIFFRACTION; A2. GROWTH FROM SOLUTIONS; B1. YB3:GD2GEMOO 8;

ABSORPTION; ABSORPTION SPECTROSCOPY; DIFFRACTION; EMISSION SPECTROSCOPY; GADOLINIUM; LASER DAMAGE; LIGHT ABSORPTION; OPTICAL PUMPING; PHOTOLUMINESCENCE; RIETVELD METHOD; RIETVELD REFINEMENT; ULTRASHORT PULSES; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; X RAYS; YTTERBIUM;

SINGLE CRYSTALS;

EID: 79952738658     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.10.188     Document Type: Conference Paper

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