Stacking fault in Bi2Te3 and Sb2Te 3 single crystals

Journal of Crystal Growth

Volumn 318, Issue 1, 2011, Pages 1179-1183

  Jariwala, Bhakti ^a   Shah, D V ^a  

^a SARDAR VALLABHBHAI NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

A1. X ray diffraction; A2. Single crystal growth; A2. Zone melting; B1. Bismuth compounds; B1. Tellurites; B2. Semiconducting materials

Indexed keywords

A2. SINGLE CRYSTAL GROWTH; A2. ZONE MELTING; B1. BISMUTH COMPOUNDS; B1. TELLURITES; SEMICONDUCTING MATERIALS;

ANTIMONY; BISMUTH; BISMUTH COMPOUNDS; CITRIC ACID; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); ETCHING; MELTING; METALLURGY; NITRIC ACID; SEMICONDUCTOR GROWTH; SOLIDS; X RAY DIFFRACTION; X RAYS; ZONE MELTING;

SINGLE CRYSTALS;

EID: 79952737669     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.10.213     Document Type: Conference Paper

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