Effect of content on microstructure and dielectric performance of PI/Al2O3 hybrid films

Nanoscience and Nanotechnology Letters

Volumn 3, Issue 2, 2011, Pages 226-229

  Liu, Xiaoxu ^a,b   Yin, Jinghua ^a   Chen, Minghua ^a   Bu, Wenbin ^a   Cheng, Weidong ^c   Wu, Zhonghua ^c  

^a HARBIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HEILONGJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

Al2O3 PI; Dielectric Performance; SAXS; Thickness of Interface

Indexed keywords

AL2O3/PI; BREAKDOWN FIELD; DIELECTRIC PERFORMANCE; HYBRID FILM; INORGANIC PHASIS; INTERFACE LAYER; LOSS TANGENT; MASS FRACTAL DIMENSION; MASS FRACTALS; NEGATIVE DEVIATIONS; PERCOLATION THEORY; PI FILM; POLYMER CHAINS; SAXS; SCATTERING CURVE; SMALL ANGLE X-RAY SCATTERING TECHNIQUES; SOL-GEL METHODS; SURFACE FRACTAL DIMENSIONS; SURFACE FRACTALS; THICKNESS OF INTERFACE; VOLUME CONDUCTIVITY;

ALUMINUM; MICROSTRUCTURE; NANOPARTICLES; PARTIAL DISCHARGES; PHASE INTERFACES; SCATTERING; SOL-GEL PROCESS; SOLVENTS; SURFACE STRUCTURE;

FRACTAL DIMENSION;

EID: 79952723489     PISSN: 19414900     EISSN: 19414919     Source Type: Journal    
DOI: 10.1166/nnl.2011.1158     Document Type: Conference Paper

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