Cryogenic probe station for use in automated microwave and noise figure measurements

43rd ARFTG Conference Digest - Spring 1994

Volumn , Issue , 1994, Pages 34-42

  Taub, Susan R ^a   Alterovitz, Samuel A ^a   Young, Paul G ^b   Ebihara, Ben T ^a   Romanofsky, Robert R ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; ELECTRIC LINES; ELECTRONICS PACKAGING; HIGH ELECTRON MOBILITY TRANSISTORS; LIQUEFIED GASES; PROBES; SCATTERING PARAMETERS; SILICON WAFERS; SUPERFLUID HELIUM;

AUTOMATIC NETWORKS; CALIBRATION STANDARD; CRYOGENIC MEASUREMENT; CRYOGENIC PROBES; CRYOGENIC TEMPERATURES; FIGURE MEASUREMENT; TEMPERATURE CONTROLLERS; TEMPERATURE DEPENDENT;

NOISE FIGURE;

EID: 79952623076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1994.327056     Document Type: Conference Paper

References (14)

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7. D. D'Almeida and R. Anholt, "Device Characterization with an Integrated On-Wafer Thermal Probing System", Microwave Journal, pp. 94-105, March 1993.
8. H. Meschede, et al, "On-Wafer Microwave Measurement Setup for Investigations on HEMT's and High Tc Superconductors at Cryogenic Temperatures Down to 20 K", IEEE Trans. Microwave Theory Tech., vol. 40, no. 12, pp, 2325-2331, December 1992.
9. 1.xAs (X=0.85 and 0.95) MODFETs", Submitted to IEEE Electron Device Lett., January 1994.
10. R. B. Marks, "A Multi-Line Method of Network Analyzer Calibration", IEEE Transactions on Microwave Theory and Techniques, vol. 39, pp. 1205-1215, July 1991.
11. S. R. Taub and P. G. Young, "Temperature Dependent Performance of Coplanar Wave guide (CPW) on Substrates of Various Materials", to be presented at the 1994 IEEE MTT-S International Microwave Symposium, San Diego, California, May 23-27 1994.
12. Hewlett Packard Product Note 8970B/S-2, "Applications and Operation of the HP8970B Noise Figure Meter and HP 8970S Microwave Noise Figure Measurement system"
13. Hewlett Packard Product Note 8970B/S-3, "Noise Parameter Measurements Using the HP 8970B Noise Figure Meter and the ATN NP4 Noise Parameter Test Set"
14. NASA Contract Number NAS3-25931.