Optimal resolution in Fresnel Incoherent Correlation Holographic fluorescence microscopy

Optics Express

Volumn 19, Issue 6, 2011, Pages 5047-5062

  Brooker, Gary ^a,b   Siegel, Nisan ^a,b   Wang, Victor ^a,b   Rosen, Joseph ^a,b,c  

^a Johns Hopkins University   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; FLUORESCENCE; FLUORESCENCE MICROSCOPY; LIGHT MODULATION; LIGHT MODULATORS; LITHOGRAPHY; MICROSCOPES; OPTIMIZATION; THREE DIMENSIONAL;

3-D IMAGE; 3D INFORMATION; COMPLEX HOLOGRAMS; ELECTRO-OPTICS; FRESNEL; HIGH QUALITY; INCOHERENT LIGHT; MICROSCOPE FIELDS; MICROSCOPE OBJECTIVE; MICROSCOPIC IMAGING; OPTIMAL RESOLUTION; PLANE WAVE; POLARIZATION SENSITIVITY; POLLEN GRAINS; RAYLEIGH LIMIT; SERIAL SECTIONING; SIMPLE METHOD; SPATIAL LIGHT MODULATORS; SPHERICAL WAVES; TUBE LENS;

HOLOGRAMS;

ARTICLE; FLUORESCENCE MICROSCOPY; HISTOLOGY; HOLOGRAPHY; IMAGE PROCESSING; METHODOLOGY; POLLEN;

HOLOGRAPHY; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, FLUORESCENCE; POLLEN;

EID: 79952614240     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.005047     Document Type: Article

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