Stress induced by constrained sintering of 3YSZ films measured by substrate creep

Journal of the American Ceramic Society

Volumn 94, Issue 3, 2011, Pages 717-724

  Atkinson, Alan ^a   Kim, Jung Sik ^a,b   Rudkin, Robert ^a   Taub, Samuel ^a   Wang, Xin ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED STRESS; BENDING DISPLACEMENT; BI-LAYER; CONSTRAINED SINTERING; CREEP DATA; CREEP PROPERTIES; CREEP STRAIN RATE; GRAIN-BOUNDARY COMPOSITION; IN-PLANE STRESS; LOW STRESS; MAXIMUM VALUES; SCREEN-PRINTED; STRESS-INDUCED; VERTICAL STRIPS; YSZ FILMS;

ACTIVATION ENERGY; CREEP; ELASTICITY; MONITORING; SINTERED ALUMINA; STRAIN RATE; STRUCTURAL DESIGN; SUBSTRATES; VISCOSITY;

SINTERING;

EID: 79952610350     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04160.x     Document Type: Article

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