Internal residual stresses in sintered and commercial low expansion Li 2O-Al2O3-SiO2 Glass-Ceramics

Journal of the American Ceramic Society

Volumn 94, Issue 4, 2011, Pages 1206-1214

  Serbena, Francisco C ^a   Soares, Viviane Oliveira ^b   Peitl, Oscar ^b   Pinto, Haroldo ^c   Muccillo, Reginaldo ^d   Zanotto, Edgar D ^b  

^a STATE UNIVERSITY OF PONTA GROSSA   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

^d INSTITUTO DE PESQUISAS ENERGÉTICAS E NUCLEARES   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; DILATOMETERS; EXPANSION; GLASS CERAMICS; GRAIN BOUNDARIES; MICROCRACKING; RESIDUAL STRESSES; SILICA; SINTERING; X RAY DIFFRACTION;

CRYSTAL NUCLEATION AND GROWTHS; HIGH-TEMPERATURE XRD; INCREASING TEMPERATURES; INSTRUMENTED INDENTATION; MICROSTRUCTURAL DESIGN; SINTERED GLASS-CERAMICS; SYNCHROTRON X RAY DIFFRACTION; THERMAL EXPANSION COEFFICIENTS;

THERMAL EXPANSION;

EID: 79952605087     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04220.x     Document Type: Article

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