Protecting clean critical points by local disorder correlations

EPL

Volumn 93, Issue 3, 2011, Pages

  Hoyos, J A ^a   Laflorencie, N ^b   Vieira, A P ^a   Vojta, T ^c  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b UNIVERSITÉ PARIS SUD   (France)

^c MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79952594274     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/93/30004     Document Type: Article

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