X-ray, scanning electron microscopy and electrical properties of synthetic fresnoite (Ba2TiSi2O8) ceramics

Applied Physics A: Materials Science and Processing

Volumn 100, Issue 4, 2010, Pages 1191-1196

  Roy, M ^a   Barbar, S K ^a   Dave, P ^a   Jangid, S ^a   Bala, Indu ^a  

^a M L SUKHADIA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DC ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; FRESNOITES; HIGH-PURITY; LATTICE PARAMETERS; NON-CENTROSYMMETRIC; POLYCRYSTALLINE CERAMICS; SCANNING ELECTRON MICROSCOPIC; SINGLE-PHASE COMPOUND; SOLID STATE REACTION METHOD; SPACE GROUPS; STOICHIOMETRIC RATIO; STRUCTURAL MODELS; STRUCTURAL PARAMETER; TIO;

ACTIVATION ENERGY; BARIUM; BARIUM COMPOUNDS; CERAMIC MATERIALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; HOLOGRAPHIC INTERFEROMETRY; MODEL STRUCTURES; PELLETIZING; RIETVELD METHOD; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SINTERING; TITANIUM COMPOUNDS; X RAY DIFFRACTION; X RAYS;

RIETVELD REFINEMENT;

EID: 79952593166     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-010-5749-2     Document Type: Article

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