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Volumn 29, Issue 3, 2011, Pages 341-343
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Interface and defect characterization in hot-pressed ZrB2-SiC ceramics
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Author keywords
Defect; Electron microscopy; Interface; ZrB2 SiC ceramics
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Indexed keywords
AMORPHOUS LAYER;
DEFECT CHARACTERIZATION;
INTERFACE;
INTERFACIAL CHARACTERIZATION;
ORIENTATION RELATIONSHIP;
POLYTYPES;
SIC CERAMICS;
THERMAL PROTECTION MATERIAL;
THERMAL STABILITY;
TRANSITION LAYERS;
ZONE AXIS;
ZRB2-SIC CERAMICS;
CERAMIC MATERIALS;
DEFECTS;
EDGE DISLOCATIONS;
ELECTRON MICROSCOPY;
HOT PRESSING;
MECHANICAL PROPERTIES;
SILICON CARBIDE;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 79952533597
PISSN: 02634368
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ijrmhm.2010.12.010 Document Type: Article |
Times cited : (10)
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References (14)
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