Curved reflection symmetry detection with self-validation

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6495 LNCS, Issue PART 4, 2011, Pages 102-114

  Liu, Jingchen ^a   Liu, Yanxi ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION PROCESS; FEATURE POINT; PIECE-WISE; REFLECTION PATTERNS; REFLECTION SYMMETRY; SELF-VALIDATING APPROACHES; STATE-OF-THE-ART ALGORITHMS;

COMPUTER VISION;

EID: 79952491030     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-19282-1_9     Document Type: Conference Paper

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