Frequency to voltage converter as a phase controller in phase shifting interference Microscopy

International Journal of Optomechatronics

Volumn 5, Issue 1, 2011, Pages 68-79

  González Laprea, Jesús ^a   Cappelletto, José ^a   Escalona, Rafael ^a  

^a UNIVERSIDAD SIMÓN BOLÍVAR   (Venezuela)

Author keywords

Interference optical microscopy; Phase shifting

Indexed keywords

CALIBRATION METHOD; CONSTANT FREQUENCY; CONSTANT VOLTAGE; DIGITAL-TO-ANALOG CONVERTERS; ELECTRICAL SIGNAL; FREQUENCY TO VOLTAGE CONVERTERS; FREQUENCY-TO-VOLTAGE CONVERTER; IN-PHASE; INTERFERENCE MICROSCOPY; INTERFERENCE OPTICAL MICROSCOPY; INTERFEROGRAMS; NEW SYSTEM; OPTICAL MICROSCOPES; PHASE-SHIFTING; RECTANGULAR HOLES; SILICON SURFACES; SOUND CARDS; SYSTEM CALIBRATION; VOLTAGE RANGES; VOLTAGE STEP;

CALIBRATION; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; PHASE SHIFT;

DIGITAL TO ANALOG CONVERSION;

EID: 79952483253     PISSN: 15599612     EISSN: 15599620     Source Type: Journal    
DOI: 10.1080/15599612.2011.553254     Document Type: Article

References (17)

1. Buckland, J. R., J. M. Huntley, and S. R. E. Turner. 1995. Unwrapping noisy phase maps by use of a minimum-cost-matching algorithm. Applied Optics 34 (23): 5100-5108.
2. Creath, Katherine. 1989. Calibration of numerical aperture effects in interferometric microscope objectives. Applied Optics 28 (15): 3333-3338.
3. Curl, Claire L., Catherine J. Bellair, Peter J. Harris, Brendan E. Allman, Ann Roberts, Keith A. Nugent, and Lea M. D. Delbridge. 2006. Single cell volume measurement by quantitative phase microscopy (QPM): A case study of erythrocyte morphology. Cellular Physiology and Biochemistry 17: 193-200.
4. Deck, Leslie L. 2001. Multiple surface phase shifting interferometry. Optical Manufacturing and Testing IV, Proceedings of SPIE 4451: 424-431.
5. Ding, Huafeng and Gabriel Popescu. 2010. Instantaneous spatial light interference microscopy. Optics Express 18 (2): 1569-1575.
6. Escalona, Rafael, Enrique Iglesias, and José Vicens. 1994. Realization of a phase shifting interferential microscope and its application to high resolution profilometry. Instrumentation & Development 3 (4): 53-58.
7. Ge, Zongtao and Fumio Kobayashi. 2006. High-precision measurement of a fiber connector end face by use of a Mirau interferometer. Applied Optics 45 (23): 5832-5839.
8. Gutmann, Bernd and Herbert Weber. 1998. Phase-shifter calibration and error detection in phase-shifting applications: a new method. Applied Optics 37 (32): 7625-7631.
9. Hariharan, P., B. F. Oreb, and T. Eiju. 1987. Digital phase-shifting interferometry: A simple error-compensating phase calculation algorithm. Applied Optics 26 (13): 2504-2506.
10. Iwai, Hidenao, Christopher Fang-Yen, Gabriel Popescu, Adam Wax, Kamran Badizadegan, Ramachandra R. Dasari, and Michael S. Feld. 2004. Quantitative phase imaging using actively stabilized phase-shifting low-coherence interferometry. Optics Letters 29 (20): 2399-2401.
11. Kinnstaetter, K., Adolf W. Lohmann, Johannes Schwider, and Norbert Streibl. 1988. Accuracy of phase shifting interferometry. Applied Optics 27 (24): 5082-5089.
12. Langoju, Rajesh, Abhijit Patil, and Pramod Rastogi. 2006. Chirp estimation in phase-shifting interferometry. Optics Letters 31 (13): 1982-1984.
13. Patorski, Krzysztof and Adam Styk. 2006. Phase shift assessment using lattice-site representation in computer aided interferogram evaluation. Proceedings of the Symposium on Photonics Technologies 521-524.
14. Pease, Robert A. 1980. V/F Converter ICs Handle Frequency-to-Voltage Needs. http://www.national.com/an/AN/AN-C.pdf (accessed February 2011).
15. Van Wingerden, Johannes, Hans J. Frankena, and Cornelis Smorenburg. 1991. Linear approximation for measurement erros in phase shifting interferometry. Applied Optics 30 (19): 2718-2729.
16. Venema, Todd M. and Jason D. Schmidt. 2008. Optical phase unwrapping in the presence of branch points. Optics Express 16 (10): 6985-6998.
17. Wang, Zhijun and Shusun Li. 1999. Phase unwrapping through a branch-cut-based cut-bridging and window-patching method. Applied Optics 38 (5): 805-814.