SCOPUS 정보 검색 플랫폼

Expert Systems with Applications

Volumn 38, Issue 7, 2011, Pages 8690-8695

Down syndrome recognition using local binary patterns and statistical evaluation of the system

(2) Burçin, Kurt a Vasif, Nabiyev V a

a KARADENIZ TECHNICAL UNIVERSITY (Turkey)

Author keywords

Classification; Down syndrome recognition; Feature extraction; Local binary pattern

Indexed keywords

CLASSIFICATION; DOWN SYNDROME; DOWN SYNDROME RECOGNITION; EFFICIENT SYSTEMS; EUCLIDEAN DISTANCE; FACIAL FEATURE; FEATURE DESCRIPTORS; LOCAL BINARY PATTERN; LOCAL BINARY PATTERNS; MANHATTAN DISTANCE; STATISTICAL EVALUATION;

CONTENT BASED RETRIEVAL; PATTERN RECOGNITION SYSTEMS;

FEATURE EXTRACTION;

EID: 79952438466 PISSN: 09574174 EISSN: None Source Type: Journal
DOI: 10.1016/j.eswa.2011.01.076 Document Type: Article

Times cited : (58)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.