A method to characterize the sheet resistance of a laser doped line on crystalline silicon wafers for photovoltaic applications

Applied Physics Letters

Volumn 98, Issue 9, 2011, Pages

  Wang, Kee Soon ^a   Tjahjono, Budi S ^a   Uddin, Ashraf ^a   Wenham, Stuart R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON WAFERS; LINE JUNCTIONS; PHOTOVOLTAIC APPLICATIONS; TLM METHOD; TRANSFER LENGTHS; UPPER LIMITS;

ELECTRIC RESISTANCE; LASER THEORY; PHOSPHORUS; SEMICONDUCTING SILICON COMPOUNDS; SHEET RESISTANCE;

SILICON WAFERS;

EID: 79952426667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3560056     Document Type: Article

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