Measurements of photo-induced changes in the conduction properties of ALD-Zn1-xMgxO thin films

Physica Scripta T

Volumn T141, Issue , 2010, Pages

  Pettersson, J ^a   Platzer Bjorkman C ^a   Hultqvist, A ^a   Zimmermann, U ^a   Edoff, M ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITED; COMBINED EFFECT; CONDUCTION PROPERTIES; CONDUCTIVITY CHANGES; CONDUCTIVITY RELAXATION; DARK STORAGE; EXCESS CONDUCTIVITY; FREE CARRIERS; HALL MEASUREMENTS; HIGHER TEMPERATURES; PERSISTENT PHOTOCONDUCTIVITY; PHOTOINDUCED CHANGE; UV-LIGHT;

DIGITAL STORAGE; HALL MOBILITY; MAGNESIUM; THIN FILMS; ZINC;

GALVANOMAGNETIC EFFECTS;

EID: 79952389469     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/2010/T141/014010     Document Type: Conference Paper

References (16)

1. Pettersson J, Platzer-Björkman C and Edoff M 2009 Prog. Photovolt: Res. Appl. 17 460-9
2. Törndahl T, Platzer-Björkman C, Kessler J and Edoff M 2007 Prog. Photovolt: Res. Appl. 15 225-35
3. Redfield D and Bube R H 1996 Photoinduced Defects in Semiconductors (Cambridge: Cambridge University Press)
4. Lang D V and Logan R A 1977 Phys. Rev. Lett. 39 635-9
5. Orton J W and Powell M J 1980 Rep. Prog. Phys. 43 1263-307
6. Look D C, Reynolds D C, Sizelove J R, Jones R L, Litton C W, Cantwell G and Harsch W C 1998 Solid State Commun. 105 399-401
7. Maeda K, Sato M, Niikura I and Fukuda T 2005 Semicond. Sci. Technol. 20 S49-54
8. Coli G and Bajaj K K 2001 Appl. Phys. Lett. 78 2861-3
9. Törndahl T, Coronel E, Hultqvist A, Platzer-Björkman C, Leifer K and Edoff M 2009 Prog. Photovolt: Res. Appl. 17 115-25
10. Lang D V, Logan R A and Jaros M 1979 Phys. Rev. B 19 1015-30
11. Sheinkman M K and Shik A Ya 1976 Sov. Phys.-Semicond. 10 128-43
12. Jiang H X, Dissanayake A and Lin J Y 1992 Phys. Rev. B 45 4520-3
13. Jiang H X, Brown G and Lin J Y 1991 J. Appl. Phys. 69 6701-3
14. Dissanayake A S, Lin J Y and Jiang H X 1993 Phys. Rev. B 48 8145-51
15. Lorenz M R, Segall B and Woodbury H H 1964 Phys. Rev. 134 A751-60
16. Meyer Th, Engelhardt F, Parisi J and Rau U 2002 J. Appl. Phys. 91 5093-9