Quantum-based SI traceable electric-field probe

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2010, Pages 321-324

  Gordon, Joshua A ^a   Holloway, Christopher L ^a   Jefferts, Steve ^a   Heavner, Tom ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

E-FIELD; ELECTRICAL FIELD; FIELD MEASUREMENT; FUNDAMENTAL PHYSICAL CONSTANT; MICROWAVE ELECTRIC FIELD; NEW APPROACHES; SELF-CALIBRATING;

ELECTRIC FIELDS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETISM; METRIC SYSTEM; PROBES;

ATOMIC SPECTROSCOPY;

EID: 79952365582     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2010.5711293     Document Type: Conference Paper

References (6)

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6. http://www.nec.co.jp/press/en/0602/2101.html , "NEC Develops World's Smallest Fiber-Optic Electric Field Probe Utilizing Nanotechnology" (2006)