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Volumn 36, Issue 5, 2011, Pages 642-644
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Carrier fringes in the two-aperture common-path interferometer
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER FRINGES;
COMMON-PATH INTERFEROMETERS;
EXISTING METHOD;
FOURIER PLANES;
FRINGE PATTERN;
INTERFERENCE PATTERNS;
LINEAR PHASE;
NEAR-FIELD DIFFRACTION;
OPTICAL IMAGING SYSTEM;
TWO BEAMS;
INTERFEROMETERS;
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EID: 79952329899
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.36.000642 Document Type: Article |
Times cited : (30)
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References (8)
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