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Volumn 3, Issue , 2009, Pages 1919-1928

PFD of higher-order configurations of SIS with partial stroke testing capability

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; ANALYTICAL EQUATIONS; ANALYTICAL EXPRESSIONS; COMMON CAUSE FAILURE; HIGHER ORDER; K-OUT-OF-N; NUMERICAL APPROACHES; NUMERICAL PROCEDURES; PARTIAL STROKE TESTING; REDUNDANCY CONFIGURATION; SAFETY INSTRUMENTED SYSTEMS;

EID: 79952324022     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (22)
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    • Apostolakis, G.1    Chu, T.L.2
  • 2
    • 34247129334 scopus 로고    scopus 로고
    • Partial stroke testing of emergency shutdown valves
    • Bingham, K. 2005, Partial Stroke Testing of Emergency Shutdown Valves, Process West Summer 2005.
    • (2005) Process West Summer 2005
    • Bingham, K.1
  • 6
    • 0031644687 scopus 로고    scopus 로고
    • Quantifying the impact of partial stroke valve testing of safety instrumented systems
    • PII S0019057898000093
    • Gruhn, P., Pittman, J., Wiley, S. & LeBlanc, T. 1998, "Quantifying the Impact of Partial Stroke Valve Testing of Safety Instrumented Systems " ISA Transactions 37, 1998, pp. 87-94. (Pubitemid 128730896)
    • (1998) ISA Transactions , vol.37 , Issue.2 , pp. 87-94
    • Gruhn, P.1    Pittman, J.2    Wiley, S.3    LeBlanc, T.4
  • 7
    • 79952355450 scopus 로고    scopus 로고
    • Risk reduction through partial stroke testing
    • Berlin, Germany, 2004
    • Houtermans, M., Rouvroie, J.L. & Karydas, D.M. 2004, "Risk Reduction through Partial Stroke Testing", Proceedings PSAM-7, Berlin, Germany, 2004, pp. 1008-1013.
    • (2004) Proceedings PSAM-7 , pp. 1008-1013
    • Houtermans, M.1    Rouvroie, J.L.2    Karydas, D.M.3
  • 12
    • 33645714161 scopus 로고    scopus 로고
    • PartialStroke testing: Implementing for the right reasons
    • Chicago, IL
    • McCrea-Steele, R. 2005, "PartialStroke Testing: Implementing for the Right Reasons", ISA Expo 2005, Chicago, IL.
    • (2005) ISA Expo 2005
    • McCrea-Steele, R.1
  • 13
    • 84876501027 scopus 로고    scopus 로고
    • Generalizing IEC 61508 PFD equations to koon architectures
    • to be submitted for publication, 2008
    • Oliveira, L.F. 2008, "Generalizing IEC 61508 PFD Equations to koon Architectures ", DNV Internal Report, to be submitted for publication, 2008.
    • (2008) DNV Internal Report
    • Oliveira, L.F.1
  • 14
    • 77951034619 scopus 로고    scopus 로고
    • A numerical approach to calculate PFD values for koon architectures with and without partial stroke testing
    • to be submitted for publication, 2008
    • Oliveira, L.F. & Abramovitch, R. 2008, "A Numerical Approach to Calculate PFD Values for koon Architectures with and without Partial Stroke Testing", DNV Internal Report, to be submitted for publication, 2008.
    • (2008) DNV Internal Report
    • Oliveira, L.F.1    Abramovitch, R.2
  • 15
    • 79952326220 scopus 로고    scopus 로고
    • Lifecycle cost analysis of alternatives for complying with required safety integrity level at a petrochemical plant
    • Buenos Aires, May 27-29, 2008
    • Oliveira, L.F. & Chame, L.M. 2008, "Lifecycle Cost Analysis of alternatives for Complying with Required Safety Integrity Level at a Petrochemical Plant", First Latin American Process Safety Conference, Buenos Aires, May 27-29, 2008.
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    • Oliveira, L.F.1    Chame, L.M.2
  • 18
    • 79952333852 scopus 로고    scopus 로고
    • Partial stroke testing of block valves
    • Nov. 2000
    • Summers, A. 2005, "Partial Stroke Testing of Block Valves ", Control Engineering, Nov. 2000.
    • (2005) Control Engineering
    • Summers, A.1
  • 20
    • 0018541698 scopus 로고
    • Unavailability of components with inspection and repair
    • 1979
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    • Vaurio, J.K.1
  • 21
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    • Reliability quantification techniques used in the Rasmussen study
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    • Vesely, W.E. 1975, "Reliability Quantification Techniques Used in the Rasmussen Study", in Reliability and Fault Tree Analysis, R.E. Barlow et al., eds., SIAM, 1975, pp. 775-803.
    • (1975) Reliability and Fault Tree Analysis , pp. 775-803
    • Vesely, W.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.