Improved efficiency in the analysis of phased mission systems with multiple failure mode components

IEEE Transactions on Reliability

Volumn 60, Issue 1, 2011, Pages 70-79

  Reed, Sean ^a   Andrews, John D ^a   Dunnett, Sarah J ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Binary decision diagram; multiple failure mode component; non repairable system; phased mission system

Indexed keywords

COMPUTATIONAL EXPENSE; LARGE SYSTEM; MULTIPLE FAILURE MODES; NON-REPAIRABLE SYSTEM; PHASED MISSION; PHASED MISSION SYSTEMS; REPEAT ANALYSIS; TIME-PERIODS;

BINARY DECISION DIAGRAMS; FAILURE MODES; RELIABILITY ANALYSIS;

QUALITY ASSURANCE;

EID: 79952186621     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2104995     Document Type: Article

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