Wavelet-based feature extraction using probabilistic finite state automata for pattern classification

Pattern Recognition

Volumn 44, Issue 7, 2011, Pages 1343-1356

  Jin, Xin ^a   Gupta, Shalabh ^a   Mukherjee, Kushal ^a   Ray, Asok ^a  

^a The Pennsylvania State University   (United States)

Author keywords

Feature extraction; Pattern classification; Probabilistic finite state automata; Symbolic dynamics; Time series analysis

Indexed keywords

DIVERSE APPLICATIONS; EARLY DETECTION; FINITE STATE AUTOMATA; IN-SITU; LABORATORY APPARATUS; MODEL SURFACE; MOTION PROFILE; PATTERN CLASSIFICATION; PERRON-FROBENIUS OPERATOR; POLYCRYSTALLINE ALLOYS; REAL-TIME DATA; SENSOR DATA; SHIFT SPACES; SYMBOLIC DYNAMICS; TIME-FREQUENCY LOCALIZATION; TRANSITION PROBABILITY MATRIX; UNDERLYING DYNAMICS; WAVELET COEFFICIENTS; WAVELET-BASED FEATURE;

COMPUTER VISION; DAMAGE DETECTION; DECISION MAKING; DYNAMICS; FEATURE EXTRACTION; FINITE AUTOMATA; ROBOTS; STRUCTURAL HEALTH MONITORING; TIME SERIES; WAVELET TRANSFORMS;

TIME SERIES ANALYSIS;

EID: 79952184225     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2010.12.003     Document Type: Article

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