Elemental imaging via laser ionization orthogonal time-of-flight mass spectrometry

Analytical Chemistry

Volumn 83, Issue 3, 2011, Pages 1102-1107

  Huang, Rongfu ^a   Zhang, Bochao ^a   Zou, Dongxuan ^a   Hang, Wei ^a   He, Jian ^a   Huang, Benli ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALL METAL; DETECTION LIMITS; DYNAMIC RANGE; IMAGING METHOD; INSTRUMENT CONTROL; LASER IONIZATION; ORDERS OF MAGNITUDE; ORTHOGONAL TIME-OF-FLIGHT MASS SPECTROMETERS; QUANTITATIVE ANALYSIS; SIMULTANEOUS DETECTION; SPATIAL RESOLUTION; TIME OF FLIGHT MASS SPECTROMETRY; VERSATILE TOOLS;

DATA HANDLING; IONIZATION; MASS SPECTROMETRY;

MASS SPECTROMETERS;

ELEMENT; ION;

ARTICLE; CHEMISTRY; INSTRUMENTATION; LASER; MASS SPECTROMETRY; METHODOLOGY; TIME;

ELEMENTS; IONS; LASERS; MASS SPECTROMETRY; TIME FACTORS;

EID: 79952180936     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac1029693     Document Type: Article

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