Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

Review of Scientific Instruments

Volumn 82, Issue 2, 2011, Pages

  Gysin, U ^a   Rast, S ^b   Kisiel, M ^a   Werle, C ^a   Meyer, E ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b NONE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; KELVIN FORCE PROBE MICROSCOPIES; LIQUID HELIUM TEMPERATURE; LOW TEMPERATURES; NON-CONTACT; SAMPLE SURFACE; SURFACE CONTAMINATIONS; ULTRAHIGH VACUUM CONDITIONS; ULTRASENSITIVE;

MAGNETIC FIELDS; NANOCANTILEVERS; PENDULUMS; SUPERFLUID HELIUM; ULTRAHIGH VACUUM;

ATOMIC FORCE MICROSCOPY;

EID: 79952171624     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3551603     Document Type: Article

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