Purity and defect characterization of single-wall carbon nanotubes using raman spectroscopy

Journal of Nanomaterials

Volumn 2011, Issue , 2011, Pages

  Kataura, Hiromichi ^a,c   Miyata, Yasumitsu ^a,b   Mizuno, Kohei ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARC DISCHARGE; BAND INTENSITY; DEFECT CHARACTERIZATION; INTENSITY RATIO; NON DESTRUCTIVE EVALUATION; QUANTITATIVE ANALYSIS; RAMAN INTENSITIES; SEM; SEM IMAGE; SINGLE-WALL CARBON NANOTUBES; SYNTHETIC METHODS;

ABLATION; CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; DEFECT DENSITY; DEFECTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN);

THERMOGRAVIMETRIC ANALYSIS;

EID: 79952144219     PISSN: 16874110     EISSN: 16874129     Source Type: Journal    
DOI: 10.1155/2011/786763     Document Type: Article

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