α-Sexithiophene films grown on Cu(110)-(2x1)O: From monolayer to multilayers

Springer Proceedings in Physics

Volumn 129, Issue , 2009, Pages 19-21

  Oehzelt, Martin ^a,b   Berkebile, Stephen ^b   Koller, Georg ^b   Haber, Thomas ^b   Koini, Markus ^c   Werzer, Oliver ^c   Resel, Roland ^c   Ramsey, Michael G ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b UNIVERSITY OF GRAZ   (Austria)

^c GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; MOLECULES; MONOLAYERS; MULTILAYERS; SCANNING TUNNELING MICROSCOPY; THICK FILMS; X RAY ABSORPTION; X RAY DIFFRACTION;

GRAZING INCIDENCE X-RAY DIFFRACTION; MOLECULAR AXES; MONOLAYER STRUCTURES; MULTILAYER STRUCTURES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; SURFACE CORRUGATIONS; X RAY DIFFRACTION POLE FIGURE; XRD (X RAY DIFFRACTION);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79952122616     PISSN: 09308989     EISSN: 18674941     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-95930-4_3     Document Type: Chapter

References (7)

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6. M. Oehzelt, S. Berkebile, G. Koller, J. Ivanco, S. Surnev, M.G. Ramsey, in preparation.
7. M. Koini, T. Haber, O. Werzer, S. Berkebile, G. Koller, M. Oehzelt, M.G. Ramsey, R. Resel, in preparation.