Defect identification by sensor network under uncertainties

Proceedings - 2010 International Conference on Broadband, Wireless Computing Communication and Applications, BWCCA 2010

Volumn , Issue , 2010, Pages 155-158

  Furukawa, Tomonari ^a   Cheng, Jinquan ^a   Lim, Shen Hin ^a   Xu, Fei ^b   Shioya, Ryuji ^c  

^a Virginia Polytechnic Institute and State University   (United States)

^b NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

^c TOYO UNIVERSITY   (Japan)

Author keywords

Defect identification; Recursive Bayesian estimation; Sensor network; Sensor uncertainties

Indexed keywords

BELIEF FUSION; DEFECT IDENTIFICATION; INSPECTION METHODS; MULTI SENSOR; NETWORK OF SENSORS; PARAMETRIC STUDY; RECURSIVE BAYESIAN ESTIMATION; SENSOR LOCATION; SENSOR UNCERTAINTIES; STOCHASTIC IDENTIFICATION; THEORETICAL FRAMEWORK;

BAYESIAN NETWORKS; ESTIMATION; INSPECTION; SENSOR NETWORKS; TELECOMMUNICATION SYSTEMS; UNCERTAINTY ANALYSIS;

DEFECTS;

EID: 79952093558     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BWCCA.2010.64     Document Type: Conference Paper

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