Label-free DNA detection with a nanogap embedded complementary metal oxide semiconductor

Nanotechnology

Volumn 22, Issue 13, 2011, Pages

  Kim, Chang Hoon ^a   Jung, Cheulhee ^a   Lee, Kyung Bok ^b   Park, Hyun Gyu ^a   Choi, Yang Kyu ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; DIELECTRIC CONSTANTS; DNA DETECTION; GATE OXIDE THICKNESS; LABEL FREE; LABEL-FREE DETECTION; N-CHANNEL; NANO-GAP; NEGATIVE CHARGE; PROOF OF CONCEPT; SILICON CHANNEL; THIN GATE OXIDES;

DNA; FIELD EFFECT TRANSISTORS; GATE DIELECTRICS; GATES (TRANSISTOR); METALLIC COMPOUNDS; MOS DEVICES; THRESHOLD VOLTAGE;

NUCLEIC ACIDS;

DNA; METAL; NANOMATERIAL; OXIDE;

ARTICLE; CHEMISTRY; EVALUATION; GENETIC PROCEDURES; INSTRUMENTATION; SEMICONDUCTOR; ULTRASTRUCTURE;

BIOSENSING TECHNIQUES; DNA; METALS; NANOSTRUCTURES; OXIDES; SEMICONDUCTORS;

EID: 79952081708     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/13/135502     Document Type: Article

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