Polarization effects in 4Pi microscopy

Micron

Volumn 42, Issue 4, 2011, Pages 353-359

  Sheppard, Colin J R ^a,b   Gong, Wei ^a   Si, Ke ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

4Pi microscopy; Focusing; Polarization; Superresolution

Indexed keywords

4PI MICROSCOPY; APLANATIC LENS; APODIZATIONS; AXIAL IMAGING; AXIAL RESOLUTIONS; ELECTRIC DIPOLE; ELECTRIC ENERGIES; LASER TRAPPING; PERFORMANCE PARAMETERS; PI-MODE; POLARIZATION DISTRIBUTIONS; POLARIZATION EFFECT; POLARIZED ILLUMINATION; POWER INPUT; SUPER RESOLUTION; TRANSVERSE RESOLUTION;

FOCUSING; OPTICAL RESOLVING POWER; POLARIZATION;

ATOMIC PHYSICS;

EID: 79952042508     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2010.07.013     Document Type: Article

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