Detecting faults in technical indicator computations for financial market analysis

2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings

Volumn , Issue , 2010, Pages 2749-2754

  Sim, K Y ^a   Low, C S ^b   Kuo, F C ^c  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Malaysia)

^b Nextwave Solution   (Malaysia)

^c SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

Component; Metamorphic testing; Self testing; Technical analysis; Technical indicators

Indexed keywords

COMPONENT; METAMORPHIC TESTING; SELF-TESTING; TECHNICAL ANALYSIS; TECHNICAL INDICATOR;

FINANCE; INFORMATION SCIENCE; LOSSES; SOFTWARE ENGINEERING; SOFTWARE PACKAGES; TESTING;

COMMERCE;

EID: 79951981602     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICISE.2010.5689221     Document Type: Conference Paper

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